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Beilstein J. Nanotechnol. 2017, 8, 1939–1945, doi:10.3762/bjnano.8.194
Figure 1: (a) XRD and (b) grain percentages obtained from integration of the intensity of the XRD peaks of th...
Figure 2: Microstructure and crystal growth orientation of ZnO grown on silicon substrates. (a) ZnO(100) on t...
Figure 3: SEM images of the samples (a) ZnOp(100), (b) ZnOp(111), and (c) ZnOt(100).
Figure 4: AFM images (5 × 5 μm) of the samples (a) ZnOp(100) (Rq: 48.488 nm), (b) ZnOp(111) (Rq: 48.284 nm), ...
Figure 5: (a) The lattice mismatch between a ZnO(110) unit cell of 5.63 Å (× lattice constant a) by 5.20 Å (l...
Figure 6: (a) Average grain size versus strain and (b) average grain size versus cathode luminescence (CL) in...
Figure 7: Cathode luminescence spectra of the samples (a) ZnOp(100), (b) ZnOp(111), and (c) ZnOt(100) with th...
Figure 8: Reflectance spectra of the samples (a) ZnOp(100), (b) ZnOp(111), and (c) ZnOt(100) at room temperat...